Tezel, Fatma MeydaneriSaatci, BuketAri, MehmetAcer, Semra DurmusAltuner, Emine2024-09-292024-09-2920160947-83961432-0630https://doi.org/10.1007/s00339-016-0398-8https://hdl.handle.net/20.500.14619/3855Thermal conductivities of pure Sn, pure Al and Sn-x wt% Al [x = 0.5, 2.2, 25, 50, 75] binary alloys were measured by radial heat flow method and were found to be 60.60, 208.80, 69.70, 80.30, 112.30, 142.00, 188.50 W/Km, respectively. The values of electrical resistivity were measured by four-point probe method and were found to be 2.90 x 10(-8)-3.90 x 10(-7) Omega cm. The crystal structures, unit cell parameters and orientations of crystallization of the same samples were determined by X-ray diffraction. Smooth surfaces with a clear grain boundary for the samples were shown on the scanning electron microscopy micrographs. The temperature coefficients of electrical and thermal conductivity were also determined.eninfo:eu-repo/semantics/closedAccessInterfacial EnergyEutectic SystemSolid ZnConductivityBehaviorMicrostructureSimulationAluminumArticle10.1007/s00339-016-0398-82-s2.0-8498843205110Q2122WOS:000384753800036Q3