Aydin, A.Askerzade, I. N.Askerbeyli, R.2024-09-292024-09-2920231063-777X1090-6517https://doi.org/10.1063/10.0020591https://hdl.handle.net/20.500.14619/5574The escape rate of S -> R switching (from superconducting S state to unstable resistive R state) in an ac SQUID with Josephson junction based on single- and multi-band superconductors is investigated by taking the frustration effects in a multi-band superconducting state into account. Using the effective critical current approach, it is shown that the escape rate in thermal activation regime can manifest qualitative features caused by the frustration effects in two- and three-band superconductors.eninfo:eu-repo/semantics/closedAccessJosephson junctioncritical currentescape ratethermal activation regime.Article10.1063/10.00205912-s2.0-8517162085210089Q3100549WOS:001080444800001Q4