The effect of radiation on the forward and reverse bias current-voltage (I-V) characteristics of Au/(Bi4Ti3O12/SiO2)/n-Si (MFIS) structures için istatistikler
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The effect of radiation on the forward and reverse bias current-voltage (I-V) characteristics of Au/(Bi4Ti3O12/SiO2)/n-Si (MFIS) structures | 0 |
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