Frequency dependent electrical and dielectric properties of the Au/(RuO2: PVC)/n-Si (MPS) structures

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dc.authoridGUNESER, Muhammet Tahir/0000-0003-3502-2034
dc.contributor.authorGuneser, Muhammet Tahir
dc.contributor.authorElamen, Hasan
dc.contributor.authorBadali, Yosef
dc.contributor.authorAltindal, Semsettin
dc.date.accessioned2024-09-29T16:00:31Z
dc.date.available2024-09-29T16:00:31Z
dc.date.issued2023
dc.departmentKarabük Üniversitesien_US
dc.description.abstractIn this study, the electrical and dielectric characteristics of the Au/(RuO2:PVC)/n-Si structures were analyzed using the impedance spectroscopy method, including capacitance/conductance (C - G/omega) measurements in wide voltage and frequency ranges (+4 V, 5 kHz - 5 MHz) at room temperature. The main electrical parameters such as concentration of donor atoms (N-D), diffusion potential (V-D), depletion layer thickness (W-D), Fermi energy level (E-F), barrier height (phi(B)), and maximum electric field (E-m) were extracted for each measured frequency. The phi(B), W-D, and E-F values are increasing with increased frequency, while N-D and E-m exponentially decrease. The surfacestates (N-SS) were evaluated using the low-high-frequency capacitance technique. Furthermore, the basic dielectric parameters such as tangent-loss (tan delta), electrical conductivity (sigma(ac)), real and imaginary parts of epsilon*, electric-modulus (M*), and complex impedance (Z*) were investigated. The obtained results indicate that the N-SS, and RuO2:PVC organic interlayer are more effective on C and G/omega measurements.en_US
dc.identifier.doi10.1016/j.physb.2023.414791
dc.identifier.issn0921-4526
dc.identifier.issn1873-2135
dc.identifier.scopus2-s2.0-85150246513en_US
dc.identifier.scopusqualityQ2en_US
dc.identifier.urihttps://doi.org/10.1016/j.physb.2023.414791
dc.identifier.urihttps://hdl.handle.net/20.500.14619/5206
dc.identifier.volume657en_US
dc.identifier.wosWOS:001036178500001en_US
dc.identifier.wosqualityQ2en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherElsevieren_US
dc.relation.ispartofPhysica B-Condensed Matteren_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectSchottky structuresen_US
dc.subjectElectrical and dielectric propertiesen_US
dc.subjectC-V and G/omega-V characteristicsen_US
dc.subjectRuO2:PVCen_US
dc.titleFrequency dependent electrical and dielectric properties of the Au/(RuO2: PVC)/n-Si (MPS) structuresen_US
dc.typeArticleen_US

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