A NEW APPROACH TO PREPARE POLYCRYSTALLINE PbTe-TeO THIN FILM, AND ITS OPTICAL, STRUCTURAL, SURFACE AND ELECTRICAL CHARACTERIZATION

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dc.authoridkariper, ishak afsin/0000-0001-9127-301X
dc.authoridMEYDANERI TEZEL, FATMA/0000-0003-1546-875X
dc.contributor.authorTezel, Fatma Meydaneri
dc.contributor.authorKariper, I. Afsin
dc.date.accessioned2024-09-29T16:04:50Z
dc.date.available2024-09-29T16:04:50Z
dc.date.issued2021
dc.departmentKarabük Üniversitesien_US
dc.description.abstractIn this study, PbTe thin film was produced on glass substrates, via chemical bath deposition (CBD) method, with 3-h deposition time at 50(circle)C. The produced thin film had polycrystalline structure; TeO2, PbTe, PbTe3 and Te2O5 crystals that were characterized by X-ray diffraction (XRD) had tetragonal, cubic, tetragonal and monoclinic crystal structures, respectively. Reflectivity (R; in %), optical transmission (T; in %), optical bandgap (Eg), absorption, dielectric constant (epsilon), extinction coefficient (k) and refractive index (nr) of polycrystalline PbTe thin film obtained using UV-Vis spectrophotometer were 29.87%, 19.41%, 3.30eV, 0.6, 3.72, 0.05 and 4.08, respectively. Grain sizes of polycrystalline PbTe thin film varied between 8.79nm and 52.55nm. Optical and electrical conductivities of the crystals according to photon energy were calculated using optical parameters, whereas their surface morphology was characterized by scanning electron microscopy (SEM). The thickness of polycrystalline PbTe thin film was measured by atomic force microscopy (AFM), and found to be 900nm.en_US
dc.description.sponsorshipKarabuk University Scientific Research Project Uniten_US
dc.description.sponsorshipThis work was supported by the Karabuk University Scientific Research Project Unit under Contract Nos. KBU-BAP-16/1-YL-143 and KBUBAP-18-DS-159. The authors would like to thank the Karabuk University Scientific Research Project Unit.en_US
dc.identifier.doi10.1142/S0218625X21500190
dc.identifier.issn0218-625X
dc.identifier.issn1793-6667
dc.identifier.issue4en_US
dc.identifier.scopus2-s2.0-85100720499en_US
dc.identifier.scopusqualityQ3en_US
dc.identifier.urihttps://doi.org/10.1142/S0218625X21500190
dc.identifier.urihttps://hdl.handle.net/20.500.14619/6346
dc.identifier.volume28en_US
dc.identifier.wosWOS:000645140600007en_US
dc.identifier.wosqualityQ4en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherWorld Scientific Publ Co Pte Ltden_US
dc.relation.ispartofSurface Review and Lettersen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectPolycrystalline PbTe-TeOen_US
dc.subjectthin filmen_US
dc.subjectCBD methoden_US
dc.subjectoptical conductivityen_US
dc.subjectelectrical conductivityen_US
dc.subjectenergy bandgapen_US
dc.titleA NEW APPROACH TO PREPARE POLYCRYSTALLINE PbTe-TeO THIN FILM, AND ITS OPTICAL, STRUCTURAL, SURFACE AND ELECTRICAL CHARACTERIZATIONen_US
dc.typeArticleen_US

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