Reduction of S-parameter errors using singular spectrum analysis

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dc.authoridOZTURK, Turgut/0000-0002-0749-5849
dc.contributor.authorOzturk, Turgut
dc.contributor.authorUluer, Ihsan
dc.contributor.authorUnal, Ilhami
dc.date.accessioned2024-09-29T16:01:10Z
dc.date.available2024-09-29T16:01:10Z
dc.date.issued2016
dc.departmentKarabük Üniversitesien_US
dc.description.abstractA free space measurement method, which consists of two horn antennas, a network analyzer, two frequency extenders, and a sample holder, is used to measure transmission (S-21) coefficients in 75-110 GHz (W-Band) frequency range. Singular spectrum analysis method is presented to eliminate the error and noise of raw S-21 data after calibration and measurement processes. The proposed model can be applied easily to remove the repeated calibration process for each sample measurement. Hence, smooth, reliable, and accurate data are obtained to determine the dielectric properties of materials. In addition, the dielectric constant of materials (paper, polyvinylchloride-PVC, Ultralam (R) 3850HT, and glass) is calculated by thin sheet approximation and Newton-Raphson extracting techniques using a filtered S-21 transmission parameter. Published by AIP Publishing.en_US
dc.identifier.doi10.1063/1.4958664
dc.identifier.issn0034-6748
dc.identifier.issn1089-7623
dc.identifier.issue7en_US
dc.identifier.pmid27475579en_US
dc.identifier.scopus2-s2.0-84979025715en_US
dc.identifier.scopusqualityQ2en_US
dc.identifier.urihttps://doi.org/10.1063/1.4958664
dc.identifier.urihttps://hdl.handle.net/20.500.14619/5562
dc.identifier.volume87en_US
dc.identifier.wosWOS:000382448600041en_US
dc.identifier.wosqualityQ3en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.indekslendigikaynakPubMeden_US
dc.language.isoenen_US
dc.publisherAmer Inst Physicsen_US
dc.relation.ispartofReview of Scientific Instrumentsen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectFree-Space Measurementen_US
dc.subjectComplex Permittivityen_US
dc.subjectDielectric-Propertiesen_US
dc.subjectOptimizationen_US
dc.titleReduction of S-parameter errors using singular spectrum analysisen_US
dc.typeArticleen_US

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