Materials classification by partial least squares using S-parameters

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dc.authoridOZTURK, Turgut/0000-0002-0749-5849
dc.contributor.authorOzturk, Turgut
dc.contributor.authorUluer, Ihsan
dc.contributor.authorUnal, Ilhami
dc.date.accessioned2024-09-29T15:51:15Z
dc.date.available2024-09-29T15:51:15Z
dc.date.issued2016
dc.departmentKarabük Üniversitesien_US
dc.descriptionSolar Asia International Conference -- 2015 -- Savitribai Phule Pune Univ, Pune, INDIAen_US
dc.description.abstractThis paper presents a simple and usable algorithm, which is called Partial Least Squares, to classify the samples in different thicknesses and frequency range. This model employed to reconstruct the samples using S-parameters which are collected by Vector Network Analyzer in Free Space Measurement method. The relationship of between S-parameters is showed to classify the materials using proposed model. The Partial Least Squares algorithm has a good potential to classify the different samples with non-contactless and non-destructive measurement method. The classification process will be easy by using the proposed model, due to its practical and simple usage. In addition, the extraction techniques, which are Nicolson Ross Weir, Newton-Raphson, and Genetic Algorithm, are used in order to extract the dielectric constant of samples, in this study. The Newton-Raphson algorithm is selected to obtain the complex permittivity of samples since it gives best results than other extracting techniques and the results are used for classification.en_US
dc.identifier.doi10.1007/s10854-016-5404-6
dc.identifier.endpage12706en_US
dc.identifier.issn0957-4522
dc.identifier.issn1573-482X
dc.identifier.issue12en_US
dc.identifier.scopus2-s2.0-84979300864en_US
dc.identifier.scopusqualityQ2en_US
dc.identifier.startpage12701en_US
dc.identifier.urihttps://doi.org/10.1007/s10854-016-5404-6
dc.identifier.urihttps://hdl.handle.net/20.500.14619/3972
dc.identifier.volume27en_US
dc.identifier.wosWOS:000389231000057en_US
dc.identifier.wosqualityQ2en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherSpringeren_US
dc.relation.ispartofJournal of Materials Science-Materials in Electronicsen_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectFree-Space Measurementen_US
dc.subjectComplex Permittivityen_US
dc.subjectDielectric-Constanten_US
dc.subjectPermeabilityen_US
dc.titleMaterials classification by partial least squares using S-parametersen_US
dc.typeConference Objecten_US

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