Identification of the Frequency- and Voltage-Dependent Dielectric Characterization of Metal-Zn/PVA-Semiconductor Structures

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dc.contributor.authorTan, Serhat Orkun
dc.date.accessioned2024-09-29T16:04:31Z
dc.date.available2024-09-29T16:04:31Z
dc.date.issued2019
dc.departmentKarabük Üniversitesien_US
dc.description.abstractAdmittance measuring methods were applied for the dielectric characterization of a fabricated metal-semiconductor structure, which has a 150-nm polymer interlayer doped with Zn. The components of complex electric modulus and dielectric constant, loss tangent, and the ac electric conductivity parameters of this structure were calculated at room temperature. Distinct frequencies and applied biases lead to extreme changes in all acquired parameters. This alteration was seen as an increment in dielectric constant and loss tangent in view of surface states presence and dipole polarizations. The frequency increment also leads to an increase in electric modulus related with the dielectric relaxation of the polarizations and dipoles. In addition to these results, comparing with a 50-nm interlayered structure, the increment in the thickness of the interlayer increases the dielectric constant and electric modulus and reveals capacitor properties of the structure.en_US
dc.identifier.doi10.1109/TNANO.2019.2912026
dc.identifier.endpage436en_US
dc.identifier.issn1536-125X
dc.identifier.issn1941-0085
dc.identifier.scopus2-s2.0-85065446548en_US
dc.identifier.scopusqualityQ2en_US
dc.identifier.startpage432en_US
dc.identifier.urihttps://doi.org/10.1109/TNANO.2019.2912026
dc.identifier.urihttps://hdl.handle.net/20.500.14619/6177
dc.identifier.volume18en_US
dc.identifier.wosWOS:000467067000001en_US
dc.identifier.wosqualityQ2en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherIeee-Inst Electrical Electronics Engineers Incen_US
dc.relation.ispartofIeee Transactions On Nanotechnologyen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectNano-structuresen_US
dc.subjectdielectric propertiesen_US
dc.subjectinterlayeren_US
dc.subjectpolymeren_US
dc.subjectfrequency dependenceen_US
dc.titleIdentification of the Frequency- and Voltage-Dependent Dielectric Characterization of Metal-Zn/PVA-Semiconductor Structuresen_US
dc.typeArticleen_US

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