Escape rate in ac SQUID on josephson junction based on single- and multi-band superconductors in thermal activation regime
Küçük Resim Yok
Tarih
2023
Yazarlar
Dergi Başlığı
Dergi ISSN
Cilt Başlığı
Yayıncı
Aip Publishing
Erişim Hakkı
info:eu-repo/semantics/closedAccess
Özet
The escape rate of S -> R switching (from superconducting S state to unstable resistive R state) in an ac SQUID with Josephson junction based on single- and multi-band superconductors is investigated by taking the frustration effects in a multi-band superconducting state into account. Using the effective critical current approach, it is shown that the escape rate in thermal activation regime can manifest qualitative features caused by the frustration effects in two- and three-band superconductors.
Açıklama
Anahtar Kelimeler
Josephson junction, critical current, escape rate, thermal activation regime.
Kaynak
Low Temperature Physics
WoS Q Değeri
Q4
Scopus Q Değeri
Q3
Cilt
49
Sayı
9
