Escape rate in ac SQUID on josephson junction based on single- and multi-band superconductors in thermal activation regime
dc.authorid | Askerzade, Iman/0000-0003-4466-8128 | |
dc.contributor.author | Aydin, A. | |
dc.contributor.author | Askerzade, I. N. | |
dc.contributor.author | Askerbeyli, R. | |
dc.date.accessioned | 2024-09-29T16:01:11Z | |
dc.date.available | 2024-09-29T16:01:11Z | |
dc.date.issued | 2023 | |
dc.department | Karabük Üniversitesi | en_US |
dc.description.abstract | The escape rate of S -> R switching (from superconducting S state to unstable resistive R state) in an ac SQUID with Josephson junction based on single- and multi-band superconductors is investigated by taking the frustration effects in a multi-band superconducting state into account. Using the effective critical current approach, it is shown that the escape rate in thermal activation regime can manifest qualitative features caused by the frustration effects in two- and three-band superconductors. | en_US |
dc.description.sponsorship | TUEBITAK [118F093] | en_US |
dc.description.sponsorship | This study is supported by TUEBITAK Grant No. 118F093. | en_US |
dc.identifier.doi | 10.1063/10.0020591 | |
dc.identifier.endpage | 1008 | en_US |
dc.identifier.issn | 1063-777X | |
dc.identifier.issn | 1090-6517 | |
dc.identifier.issue | 9 | en_US |
dc.identifier.scopus | 2-s2.0-85171620852 | en_US |
dc.identifier.scopusquality | Q3 | en_US |
dc.identifier.startpage | 1005 | en_US |
dc.identifier.uri | https://doi.org/10.1063/10.0020591 | |
dc.identifier.uri | https://hdl.handle.net/20.500.14619/5574 | |
dc.identifier.volume | 49 | en_US |
dc.identifier.wos | WOS:001080444800001 | en_US |
dc.identifier.wosquality | Q4 | en_US |
dc.indekslendigikaynak | Web of Science | en_US |
dc.indekslendigikaynak | Scopus | en_US |
dc.language.iso | en | en_US |
dc.publisher | Aip Publishing | en_US |
dc.relation.ispartof | Low Temperature Physics | en_US |
dc.relation.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | en_US |
dc.rights | info:eu-repo/semantics/closedAccess | en_US |
dc.subject | Josephson junction | en_US |
dc.subject | critical current | en_US |
dc.subject | escape rate | en_US |
dc.subject | thermal activation regime. | en_US |
dc.title | Escape rate in ac SQUID on josephson junction based on single- and multi-band superconductors in thermal activation regime | en_US |
dc.type | Article | en_US |