Synthesis, surface tension, optical and dielectric properties of bismuth oxide thin film
Küçük Resim Yok
Tarih
2017
Yazarlar
Dergi Başlığı
Dergi ISSN
Cilt Başlığı
Yayıncı
De Gruyter Open Ltd
Erişim Hakkı
info:eu-repo/semantics/openAccess
Özet
Bismuth oxide thin film was deposited by chemical bath deposition (CBD) technique onto a glass substrate. The grain size (D), dislocation density (delta) and number of crystallites per unit area (N), i.e. structural properties of the thin film were determined as 16 nm, 39.06 x 10(-4) line/nm(2), 31.25 x 10(-3) 1/nm(2), respectively. Optical transmittance properties of the thin film were investigated by using a UV-Vis spectrophotometer. The optical band gap (E-g) for direct transitions, optical transmission (T %), reflectivity (R %), absorption, refractive index (n(r)), extinction coefficient (k), dielectric constant (is an element of) of the thin film were found to be 3.77 eV, 25.23 %, 32.25 %, 0.59, 3.62, 0.04 and 2.80, respectively. The thickness of the film was measured by AFM, and was found to be 128 nm. Contact angles of various liquids on the oxide thin film were determined by Zisman method, and surface tension was calculated to be 31.95 mN/m.
Açıklama
Anahtar Kelimeler
CBD technique, crystal growth, Zisman method, optical properties, surface tension
Kaynak
Materials Science-Poland
WoS Q Değeri
Q4
Scopus Q Değeri
N/A
Cilt
35
Sayı
1
