Synthesis, surface tension, optical and dielectric properties of bismuth oxide thin film

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dc.authoridMEYDANERI TEZEL, FATMA/0000-0003-1546-875X
dc.contributor.authorTezel, Fatma Meydaneri
dc.contributor.authorKariper, I. Afsin
dc.date.accessioned2024-09-29T16:06:14Z
dc.date.available2024-09-29T16:06:14Z
dc.date.issued2017
dc.departmentKarabük Üniversitesien_US
dc.description.abstractBismuth oxide thin film was deposited by chemical bath deposition (CBD) technique onto a glass substrate. The grain size (D), dislocation density (delta) and number of crystallites per unit area (N), i.e. structural properties of the thin film were determined as 16 nm, 39.06 x 10(-4) line/nm(2), 31.25 x 10(-3) 1/nm(2), respectively. Optical transmittance properties of the thin film were investigated by using a UV-Vis spectrophotometer. The optical band gap (E-g) for direct transitions, optical transmission (T %), reflectivity (R %), absorption, refractive index (n(r)), extinction coefficient (k), dielectric constant (is an element of) of the thin film were found to be 3.77 eV, 25.23 %, 32.25 %, 0.59, 3.62, 0.04 and 2.80, respectively. The thickness of the film was measured by AFM, and was found to be 128 nm. Contact angles of various liquids on the oxide thin film were determined by Zisman method, and surface tension was calculated to be 31.95 mN/m.en_US
dc.description.sponsorshipKarabuk University Scientific Research Project [KBU-BAP-13/1-YL-033]; Erciyes University Technoparken_US
dc.description.sponsorshipThis work was supported by the Karabuk University Scientific Research Project Unit under Contract No. KBU-BAP-13/1-YL-033 and the Erciyes University Technopark. The authors would like to thank the Karabuk University Scientific Research Project Unit for their financial support.en_US
dc.identifier.doi10.1515/msp-2017-0020
dc.identifier.endpage93en_US
dc.identifier.issn2083-134X
dc.identifier.issue1en_US
dc.identifier.scopus2-s2.0-85019122494en_US
dc.identifier.scopusqualityN/Aen_US
dc.identifier.startpage87en_US
dc.identifier.urihttps://doi.org/10.1515/msp-2017-0020
dc.identifier.urihttps://hdl.handle.net/20.500.14619/6715
dc.identifier.volume35en_US
dc.identifier.wosWOS:000401443100012en_US
dc.identifier.wosqualityQ4en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherDe Gruyter Open Ltden_US
dc.relation.ispartofMaterials Science-Polanden_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectCBD techniqueen_US
dc.subjectcrystal growthen_US
dc.subjectZisman methoden_US
dc.subjectoptical propertiesen_US
dc.subjectsurface tensionen_US
dc.titleSynthesis, surface tension, optical and dielectric properties of bismuth oxide thin filmen_US
dc.typeArticleen_US

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