Escape rate in ac SQUID on Josephson junction based on single- and multi-band superconductors in thermal activation regime
Küçük Resim Yok
Tarih
2023
Yazarlar
Dergi Başlığı
Dergi ISSN
Cilt Başlığı
Yayıncı
B.Verkin Institute for Low Temperature Physics and Engineering of the NAS of Ukraine
Erişim Hakkı
info:eu-repo/semantics/closedAccess
Özet
The escape rate of S?R switching (from superconducting S state to unstable resistive R state) in an ac SQUID with Josephson junction based on single- and multi-band superconductors is investigated by taking the frustration effects in a multi-band superconducting state into account. Using the effective critical current approach, it is shown that the escape rate in thermal activation regime can manifest qualitative features caused by the frustration effects in two- and three-band superconductors. © 2023 Institute for Low Temperature Physics and Engineering. All rights reserved.
Açıklama
Anahtar Kelimeler
critical current, escape rate, Josephson junction, thermal activation regime
Kaynak
Fizika Nizkikh Temperatur
WoS Q Değeri
Scopus Q Değeri
Q4
Cilt
49
Sayı
9
