Escape rate in ac SQUID on Josephson junction based on single- and multi-band superconductors in thermal activation regime

dc.contributor.authorAydin, A.
dc.contributor.authorAskerzade, I.N.
dc.contributor.authorAskerbeyli, R.
dc.date.accessioned2024-09-29T16:22:40Z
dc.date.available2024-09-29T16:22:40Z
dc.date.issued2023
dc.departmentKarabük Üniversitesien_US
dc.description.abstractThe escape rate of S?R switching (from superconducting S state to unstable resistive R state) in an ac SQUID with Josephson junction based on single- and multi-band superconductors is investigated by taking the frustration effects in a multi-band superconducting state into account. Using the effective critical current approach, it is shown that the escape rate in thermal activation regime can manifest qualitative features caused by the frustration effects in two- and three-band superconductors. © 2023 Institute for Low Temperature Physics and Engineering. All rights reserved.en_US
dc.description.sponsorshipTürkiye Bilimsel ve Teknolojik Araştırma Kurumu, TÜBİTAK, (118F093); Türkiye Bilimsel ve Teknolojik Araştırma Kurumu, TÜBİTAKen_US
dc.identifier.endpage1111en_US
dc.identifier.issn0132-6414
dc.identifier.issue9en_US
dc.identifier.scopus2-s2.0-85173616715en_US
dc.identifier.scopusqualityQ4en_US
dc.identifier.startpage1107en_US
dc.identifier.urihttps://hdl.handle.net/20.500.14619/10207
dc.identifier.volume49en_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherB.Verkin Institute for Low Temperature Physics and Engineering of the NAS of Ukraineen_US
dc.relation.ispartofFizika Nizkikh Temperaturen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectcritical currenten_US
dc.subjectescape rateen_US
dc.subjectJosephson junctionen_US
dc.subjectthermal activation regimeen_US
dc.titleEscape rate in ac SQUID on Josephson junction based on single- and multi-band superconductors in thermal activation regimeen_US
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dc.typeArticleen_US

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